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Measuring the Interaction Force Between a Droplet and a Super-hydrophobic Substrate by the Optical Lever Method
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Sensitive measurement of forces at the micron scale using Bloch oscillations of ultracold atoms

I Carusotto1, L Pitaevskii, S Stringari

  • 1Istituto Nazionale per Fisica per la Materia BEC-CRS and Dipartimento di Fisica, Universitá di Trento, I-38050 Povo, Italy.

Physical Review Letters
|October 4, 2005
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...