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Factor structure and external validity of the PANSS revisited

Edwin J C G Van den Oord1, Dan Rujescu, Jaime R Robles

  • 1Virginia Institute for Psychiatric and Behavioral Genetics, Medical College of Virginia of Virginia Commonwealth University, P.O. Box 980126, Richmond VA 23298-0126, USA. ejvandenoord@vcu.edu

Schizophrenia Research
|October 19, 2005
PubMed
Summary

This study revisits the Positive and Negative Syndrome Scale (PANSS) in schizophrenia research. A six-factor model demonstrated good fit and external validity, clarifying PANSS utility.

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