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In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
09:26

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on: June 26, 2015

Dielectric breakdown model for composite materials

F Peruani1, G Solovey, I M Irurzun

  • 1Departamento de Fisica, Juan José Giambiagi, FCEyN, UBA, Buenos Aires, Argentina.

Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
|October 26, 2005
PubMed

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