Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Dynamics of dielectric breakdown paths.

Jeffrey Boksiner1, P L Leath

  • 1Department of Physics and Astronomy, Rutgers, the State University of New Jersey, Piscataway, New Jersey 08854-8019, USA. boksiner@physics.rutgers.edu

Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
|October 26, 2005
PubMed
Summary
This summary is machine-generated.

Dielectric breakdown paths in materials bifurcate or grow linearly based on material properties and breakdown delay. The study reveals oscillating propagation velocities and a phase diagram for these phenomena.

Related Experiment Videos

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Exact Solution to an Interacting Extreme-Value Problem: The Pure-Flaw Model.

Journal of research of the National Institute of Standards and Technology·2023
See all related articles

Area of Science:

  • Physics
  • Materials Science
  • Electrical Engineering

Background:

  • Dielectric breakdown is crucial for electrical insulation and device reliability.
  • Understanding breakdown path dynamics, especially with defects, is essential for predicting material failure.
  • Needle defects introduce localized field enhancements, influencing breakdown geometry.

Purpose of the Study:

  • To model and analyze the dynamics and geometry of dielectric breakdown paths originating from needle defects.
  • To investigate the influence of residual resistivity and breakdown delay time on breakdown path evolution.
  • To identify conditions leading to one-dimensional growth versus fractal bifurcation and spontaneous oscillations.

Main Methods:

  • Development of a time-dependent electrical-circuit model using a semi-infinite lattice of parallel capacitors and resistors.
  • Simulation of breakdown initiation when local electric fields exceed a critical value within a specific delay time.
  • Analysis of cases with varying initial and residual resistances (infinite, finite, zero).

Main Results:

  • Breakdown paths exhibit either one-dimensional growth or fractal bifurcation, contingent on residual resistance and breakdown delay.
  • Spontaneous oscillations in the propagation velocity of the breakdown path were observed.
  • A phase diagram illustrating the conditions for bifurcation and oscillations was established.

Conclusions:

  • The study provides a comprehensive model for dielectric breakdown dynamics around needle defects.
  • The findings offer insights into predicting breakdown behavior and designing more robust electrical insulation systems.
  • A simplified recursive map approximation effectively explains the observed complex dynamics.