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Mineral content changes in bone associated with damage induced by the electron beam
Roy D Bloebaum1, Jennifer L Holmes, John G Skedros
1Bone and Joint Research Laboratory, Department of Veterans Affairs Medical Center, Salt Lake City Health Care System, Salt Lake City, UT 84148-9998, USA. Roy.Bloebaum@hsc.utah.edu
Scanning
|November 5, 2005
Summary
Electron beam damage can affect bone mineral content analysis. Using lower magnification in scan mode and avoiding prolonged exposure minimizes errors in energy-dispersive x-ray (EDX) and backscattered electron (BSE) imaging.
Area of Science:
- Materials Science
- Biomineralization
- Analytical Chemistry
Background:
- Energy-dispersive X-ray (EDX) spectroscopy and backscattered electron (BSE) imaging are crucial for analyzing mineral content in bone at microscopic levels.
- Electron beam bombardment during these analyses can induce tissue damage, potentially leading to inaccurate mineral content interpretations.
Purpose of the Study:
- To quantify the deleterious effects of electron beam exposure on bone mineral content analysis.
- To investigate the impact of scanning time, mode (scan vs. point), magnification, and embedding medium (PMMA) on analytical results.
Main Methods:
- Undemineralized human cortical bone specimens were analyzed using coupled BSE/EDX.
- Specimens were examined under varying conditions: 200x embedded, 200x unembedded, and 1000x embedded.
- Elemental (Ca, P, C) proportions and mineral content (BSE gray levels) were measured across five consecutive analyses.
Main Results:
- Point mode analysis at 200x showed significant increases in Ca (7.2%) and decreases in C (-3.2%) by the second measurement.
- Higher magnification (1000x) resulted in significantly larger variations in Ca, P, and C proportions.
- BSE gray levels increased by up to 23% in point mode, suggesting increased mineral content due to beam damage.
Conclusions:
- Coupled BSE/EDX analyses in PMMA-embedded bone can yield reliable mineral content measurements.
- Utilizing lower magnifications in scan mode and minimizing electron beam exposure are critical for accurate results.
- For point mode analysis of small regions, adjustments to accelerating voltage and probe current may be necessary to mitigate beam-induced damage.