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Updated: Aug 14, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

On the importance of fifth-order spherical aberration for a fully corrected electron microscope

L Y Chang1, A I Kirkland, J M Titchmarsh

  • 1Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom. lanyun.chang@materials.ox.ac.uk

Ultramicroscopy
|November 29, 2005
PubMed

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