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Related Experiment Videos

In-line interferometer for direction-sensitive displacement measurements by optical feedback detection.

Alvarado Tarun1, Julius Jecong, Caesar Saloma

  • 1National Institute of Physics, University of the Philippines, Diliman, Quezon City 1101, Philippines.

Applied Optics
|December 16, 2005
PubMed
Summary

This study presents a compact interferometer using semiconductor laser optical feedback for precise displacement measurement. It accurately detects movement direction and magnitude, showing robustness in its performance.

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Area of Science:

  • Optics and Photonics
  • Semiconductor Lasers
  • Metrology

Background:

  • Optical interferometers are crucial for precise measurements.
  • Semiconductor lasers offer compact and versatile light sources.
  • Direction-sensitive displacement measurement presents unique challenges.

Purpose of the Study:

  • To demonstrate a compact in-line interferometer for direction-sensitive displacement measurement.
  • To utilize optical feedback detection with a semiconductor laser (SL).
  • To investigate and optimize the operating conditions of the SL interferometer.

Main Methods:

  • Developing a compact in-line interferometer configuration.
  • Employing a semiconductor laser (SL) as the light source and detection medium.

Related Experiment Videos

  • Interfering beams from a reference mirror and test object within the SL.
  • Performing numerical and experimental investigations of interferometer performance.

    • Main Results:

    • The SL output power variation accurately indicates displacement magnitude and direction.
    • Optimal operating conditions for the interferometer were identified.
    • The system demonstrated robustness against variations in optical feedback and scale.

    Conclusions:

    • A compact, direction-sensitive displacement measurement system using SL optical feedback is feasible.
    • The developed interferometer offers accurate and robust performance.
    • This technology has potential applications in precision metrology and sensing.