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Explorative statistical analysis of planar point processes in microscopy.
1Department of Pathology, University of Ulm, Germany. feldt@medizin.uni-ulm.de
Journal of Microscopy
|December 21, 2005
Summary
This study reviews exploratory statistical analysis for planar point processes, using second-order functions like the K-function to classify patterns as random, clustering, or repulsive. These methods are applicable to both genuine planar and stereological cases in microscopy and other fields.
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