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Related Experiment Videos

Measuring the angular dependent energy distribution of backscattered electrons at variable geometry.

J Wagner1, W Stummer, M Völkerer

  • 1Graz University of Technology, Institute for Electron Microscopy, Austria. julian.wagner@felmi-zfe.at

Scanning
|December 24, 2005
PubMed
Summary

This study presents a novel aluminium semisphere system for analyzing electron backscattering. The system enables detailed angular and energy distribution measurements of backscattered electrons from bulk samples.

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Area of Science:

  • Materials Science
  • Surface Analysis
  • Electron Microscopy

Background:

  • Characterizing electron backscattering is crucial for understanding material properties.
  • Existing methods may lack comprehensive angular and energy resolution.
  • Developing advanced detection systems is essential for precise analysis.

Purpose of the Study:

  • To introduce a new aluminium semisphere system for detailed backscattered electron analysis.
  • To enable simultaneous measurement of angular and energy distributions.
  • To provide a platform for normalization and comparison with established coefficients.

Main Methods:

  • Utilized an aluminium semisphere with 120 entry points and eight detection areas.
  • Employed polar and azimuthal rotations for complete angular distribution mapping.

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  • Incorporated operational amplifiers for signal amplification and variable counter voltage for energy resolution.
  • Performed specimen current measurements for normalization.

    • Main Results:

    • The system successfully acquired complete angular distribution data of backscattered electrons.
    • Simultaneous energy resolution measurements were achieved for each detection area.
    • The setup allows for normalization and comparison with total backscattering coefficients.

    Conclusions:

    • The developed aluminium semisphere system offers a robust method for comprehensive backscattered electron analysis.
    • The system's design facilitates detailed investigation of electron-sample interactions.
    • This approach enhances the precision and scope of surface analysis techniques.