Ruth A Zolock1, Guangming Li, Charles Bleckmann
1Department of Systems and Engineering Management, Air Force Institute of Technology, 2950 Hobson Way, Bldg 640, Wright-Patterson AFB, OH 45433-7765, USA.
Atomic force microscopy (AFM) revealed distinct Bacillus spore surface morphologies. These characteristic features allow differentiation between closely related Bacillus species, aiding in identification.
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