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Updated: Aug 14, 2026

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
Published on: February 5, 2017
Scaling law in carbon nanotube electromechanical devices
R Lefèvre1, M F Goffman, V Derycke
1Laboratoire d'Electronique Moléculaire, CEA-DSM SPEC, CEA Saclay, 91191 Gif-sur-Yvette, France.
Abstract:
We report a method for probing electromechanical properties of multiwalled carbon nanotubes (CNTs). This method is based on atomic force microscopy measurements on a doubly clamped suspended CNT electrostatically deflected by a gate electrode. We measure the maximum deflection as a function of the applied gate voltage. Data from different CNTs scale into an universal curve within the experimental accuracy, in agreement with a continuum model prediction. This method and the general validity of the scaling law constitute a very useful tool for designing actuators and in general conducting nanowire-based nanoelectromechanical systems.
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