X-ray topography analysis of acoustic wave fields in the SAW-resonator structures

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Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
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Published on: March 6, 2017

Dmitry V Roshchupkin1, Helen D Roshchupkina, Dmitry V Irzhak

  • 1Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences, Laboratory of X-ray Acoustooptics, Chernogolovka, Russian Federation. rochtch@ipmt-hpm.ac.ru

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
|January 21, 2006
PubMed

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