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Updated: Aug 1, 2026

Sample Drift Correction Following 4D Confocal Time-lapse Imaging
Published on: April 13, 2014
An approach to the systematic distortion correction in aberration-corrected HAADF images
A M Sanchez1, P L Galindo, S Kret
1Departamento de Ciencia de los Materiales e I.M. y Q.I., Universidad de Cadiz, Puerto Real, 11510, Spain. ana.fuentes@uca.es
Abstract:
Systematic distortion has been analysed in high-angle annular dark-field (HAADF) images which may be caused by electrical interference. Strain mapping techniques have been applied to a strain-free GaAs substrate in order to provide a broad analysis of the influence of this distortion on the determination of local strain in the heterostructure. We have developed a methodology for estimating the systematic distortion, and we correct the original images by using an algorithm that removes this systematic distortion.
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