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Formation of Thick Dense Yttrium Iron Garnet Films Using Aerosol Deposition
Published on: May 15, 2015
HRTEM and EELS study of Y2O3/MgO thin films
F Pailloux1, D Imhoff, M Jublot
1Laboratoire de Métallurgie Physique, CNRS/Université de Poitiers, UMR 6630, 86962 Futuroscope-Chasseneuil, France. frederic.pailloux@univ-poitiers.fr
Micron (Oxford, England : 1993)
|February 10, 2006
Summary
High-resolution transmission electron microscopy and electron energy loss spectroscopy revealed a novel atomic arrangement in yttrium oxide (Y2O3) thin films. This finding highlights the power of combining multiple advanced techniques for nanoscale structural determination.
Area of Science:
- Materials Science
- Solid State Physics
- Nanotechnology
Background:
- Yttrium oxide (Y2O3) thin films are crucial in various technological applications.
- Understanding the crystallographic structure of Y2O3 films at the nanoscale is essential for optimizing their properties.
- Previous studies have primarily focused on the well-known Ia3 structure of Y2O3.
Purpose of the Study:
- To investigate the crystallographic structure of Y2O3 thin films deposited on a (001)-MgO substrate.
- To identify and characterize different phases or atomic arrangements within the thin film, particularly near the interface.
- To demonstrate the effectiveness of combining advanced microscopy and spectroscopy with theoretical calculations for nanoscale structural analysis.
Main Methods:
- High-resolution transmission electron microscopy (HRTEM) for imaging film microstructure.
- Electron energy loss spectroscopy (EELS) for elemental and chemical state analysis.
- Digital image processing of HRTEM data and spectrum imaging with EELS.
- Self-consistent full multiple scattering (SC-FMS) calculations for spectral analysis.
Main Results:
- HRTEM revealed grains with crystallographic structures distinct from the predominant Ia3 phase.
- EELS analysis identified two distinct O K-edge spectra within the Y2O3 film.
- One spectrum matched the Ia3 structure, while the other correlated well with an octahedral atomic arrangement of Y and O atoms, not fitting other known Y2O3 structures.
- SC-FMS calculations were crucial in identifying the novel atomic arrangement.
Conclusions:
- Y2O3 thin films can exhibit complex microstructures with multiple crystallographic phases.
- A novel atomic arrangement, distinct from hexagonal or monoclinic Y2O3, was identified and characterized using combined experimental and computational methods.
- The study underscores the importance of integrating HRTEM, EELS, and SC-FMS for accurate nanoscale structural determination.
