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High density germanium nanowire assemblies: contact challenges and electrical characterization.

Donats Erts1, Boris Polyakov, Brian Daly

  • 1Department of Chemistry, Materials Section and Supercritical Fluid Centre, University College Cork, Cork, Ireland.

The Journal of Physical Chemistry. B
|February 14, 2006
PubMed
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Conductive properties of germanium nanowires in AAO templates were measured using C-AFM and macrocontacts. Both methods accurately assessed electrical transport, crucial for future electronic device fabrication.

Area of Science:

  • Materials Science
  • Nanotechnology
  • Electrical Engineering

Background:

  • Vertically aligned germanium nanowires (GeNWs) are promising for nanoelectronic devices.
  • Anodized aluminum oxide (AAO) templates offer a structured matrix for nanowire growth.
  • Characterizing electrical properties of encapsulated nanowires is challenging but essential.

Purpose of the Study:

  • To characterize the conductive properties of germanium nanowires within AAO templates.
  • To compare the effectiveness of conductive atomic force microscopy (C-AFM) and macrocontact measurements for evaluating GeNW conductivity.
  • To assess the impact of defects on charge transport in GeNW arrays.

Main Methods:

  • Utilized conductive atomic force microscopy (C-AFM) for individual nanowire analysis.

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  • Employed macrocontact measurements for bulk nanowire array characterization.
  • Minimized contact resistance via AAO surface polishing and etching before metal deposition.
  • Performed impedance spectroscopy to analyze defect influence on charge transport.

    • Main Results:

    • C-AFM and macrocontact measurements yielded comparable conductivity data for GeNWs.
    • Both C-AFM and macrocontact methods are suitable for evaluating encapsulated nanowires.
    • Impedance measurements provided insights into defect-mediated charge transport.

    Conclusions:

    • Effective ohmic contacts to nanowires within arrays are critical for bottom-up device fabrication.
    • The study validates C-AFM and macrocontact methods for characterizing nanowire conductivity.
    • These findings support the development of advanced electronic and optoelectronic devices using ordered nanowire arrays.