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Updated: Jul 13, 2026

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
Published on: April 4, 2017
Quantum metrology
Vittorio Giovannetti1, Seth Lloyd, Lorenzo Maccone
1NEST-CNR-INFM & Scuola Normale Superiore, Piazza dei Cavalieri 7, I-56126, Pisa, Italy.
Abstract:
We point out a general framework that encompasses most cases in which quantum effects enable an increase in precision when estimating a parameter (quantum metrology). The typical quantum precision enhancement is of the order of the square root of the number of times the system is sampled. We prove that this is optimal, and we point out the different strategies (classical and quantum) that permit one to attain this bound.
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