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Updated: Aug 11, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Single electron on a nanodot in a double-barrier tunneling structure observed by noncontact atomic-force spectroscopy

Yasuo Azuma1, Masayuki Kanehara, Toshiharu Teranishi

  • 1Department of Physical Electronics, Tokyo Institute of Technology, Tokyo 152-8552, Japan.

Physical Review Letters
|February 21, 2006
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...