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Updated: Aug 11, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Substrate effect on the melting temperature of thin polyethylene films
Y Wang1, M Rafailovich, J Sokolov
1Department of Materials Science and Engineering, SUNY at Stony Brook, Stony Brook, New York 11794-2275, USA.
Abstract:
Strong dependence of the crystal orientation, morphology, and melting temperature (Tm) on the substrate is observed in the semicrystalline polyethylene thin films. The Tm decreases with the film thickness decrease when the film is thinner than a certain critical thickness, and the magnitude of the depression increases with increasing surface interaction. We attribute the large Tm depression to the decrease in the overall free energy on melting, which is caused by the substrate attraction force to the chains that competes against the interchain force which drives the chains to crystallization.
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