Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Chaos in atomic force microscopy.

Shuiqing Hu1, Arvind Raman

  • 1Birck Nanotechnology Center and School of Mechanical Engineering, Purdue University, West Lafayette, Indiana 47907, USA.

Physical Review Letters
|February 21, 2006
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

FES suppresses macrophage-mediated inflammation and atherosclerotic plaque formation by modulating the PU.1/Arg1 axis.

International journal of biological macromolecules·2026
Same author

LL-37 transports immunoreactive cGAMP to activate STING signaling and enhance interferon-mediated host antiviral immunity.

Cell reports·2025
Same author

Diabetic vascular calcification inhibited by soluble epoxide hydrolase gene deletion via regressing NID2-mediated IGF2-ERK1/2 signaling pathway.

Chinese medical journal·2025
Same author

Force Volume Atomic Force Microscopy-Infrared for Simultaneous Nanoscale Chemical and Mechanical Spectromicroscopy.

ACS nano·2025
Same author

Screening and Evaluation of CO<sub>2</sub> Thickening Agents Based on Molecular Dynamics Simulation Technology.

ACS omega·2025
Same author

Experimental Analysis of Gas Injection Feasibility and Evaluation of Enhanced Recovery Potential in Mahu Tight Conglomerate Reservoirs.

ACS omega·2024

Chaotic oscillations in dynamic atomic force microscopy (AFM) were observed in microcantilever tips. This "deterministic" uncertainty introduces nanoscale metrology errors in AFM imaging.

Area of Science:

  • Physics
  • Materials Science
  • Nanotechnology

Background:

  • Atomic Force Microscopy (AFM) is a high-resolution surface imaging technique.
  • Microcantilevers are key components in dynamic AFM, enabling nanoscale measurements.
  • Understanding microcantilever dynamics is crucial for accurate AFM operation.

Purpose of the Study:

  • To report and characterize chaotic oscillations in microcantilever tips during dynamic AFM.
  • To investigate the transition from periodic to chaotic behavior in microcantilevers.
  • To quantify the impact of chaotic oscillations on nanoscale metrology.

Main Methods:

  • Systematic experimental investigations across various microcantilevers and operating conditions.
  • Analysis of tip oscillation data using Lyapunov exponent calculations.

Related Experiment Videos

  • Noise titration methods to confirm the chaotic nature of oscillations.
  • AFM imaging using chaotically oscillating tips to assess metrology errors.

    • Main Results:

    • Softer microcantilevers exhibit a bifurcation from periodic to chaotic oscillations near the noncontact-to-tapping regime transition.
    • Lyapunov exponent and noise titration analyses confirm the chaotic nature of these tip oscillations.
    • AFM images acquired with chaotically oscillating tips demonstrate small but significant nanoscale metrology errors.

    Conclusions:

    • Chaotic oscillations in dynamic AFM microcantilevers are a confirmed phenomenon.
    • The transition to chaotic behavior introduces "deterministic" uncertainty impacting nanoscale measurements.
    • These findings highlight the need to account for chaotic dynamics to improve AFM metrology accuracy.