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Multilayer X-ray optics at CHESS.

Alexander Kazimirov1, Detlef M Smilgies, Qun Shen

  • 1Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, NY 14853-8001, USA. ayk7@cornell.edu

Journal of Synchrotron Radiation
|February 24, 2006
PubMed
Summary
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Multilayer optics enhance X-ray flux by 100x at Cornell High Energy Synchrotron Source (CHESS) beamlines. Advanced designs offer improved resolution and wider bandwidths for crystallography and other X-ray techniques.

Area of Science:

  • Materials Science
  • Optics
  • Physics

Background:

  • Multilayer optics are crucial for X-ray beamlines at the Cornell High Energy Synchrotron Source (CHESS).
  • Traditional multilayers offer significant X-ray flux enhancement compared to standard silicon optics.
  • Various multilayer designs exist, including sagittal-focusing and high-resolution types.

Purpose of the Study:

  • To discuss the characteristics and applications of different multilayer optics at CHESS.
  • To highlight advancements in multilayer technology for X-ray science.
  • To explore the potential of new multilayer designs for macromolecular crystallography.

Main Methods:

  • Characterization of traditional, sagittal-focusing, high-resolution, wide-bandpass, and small d-spacing multilayers.

Related Experiment Videos

  • Analysis of Mo/B4C and W/B4C multilayer performance at higher energies.
  • Introduction of chemical vapor deposited SiC as a substrate material.
  • Main Results:

    • Multilayer optics provide flux enhancement factors of 10^2 over standard Si(111) optics.
    • Sagittal-focusing multilayers add a 10x gain in flux density.
    • High-resolution (DeltaE/E ~0.2%) and wide-bandpass (DeltaE/E = 5%, 10%) multilayers are utilized.
    • Small d-spacing multilayers extend the energy range, with Mo/B4C and W/B4C showing improved performance.
    • Chemical vapor deposited SiC demonstrates superior thermal conductivity as a substrate.

    Conclusions:

    • Multilayer optics are versatile tools at CHESS, enabling various X-ray scattering, diffraction, and imaging techniques.
    • Ongoing development of multilayer optics continues to push the boundaries of X-ray science.
    • New materials and designs enhance performance, offering greater possibilities for research.