1Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ 08854, USA. jingwang@caip.rutgers.edu
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
This study introduces a new imaging method to capture fine surface details on shiny objects. The technique accurately measures relief texture and reflectance, overcoming limitations of traditional laser scanning for specular materials.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: