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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Nanostructure dependence of field-effect mobility in regioregular poly(3-hexylthiophene) thin film field effect

Rui Zhang1, Bo Li, Mihaela C Iovu

  • 1Department of Chemistry, Carnegie Mellon University, 4400 Fifth Avenue, Pittsburgh, Pennsylvania 15213, USA.

Journal of the American Chemical Society
|March 16, 2006
PubMed

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