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Updated: Aug 10, 2026
Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses
Published on: June 6, 2017
Ellipsometry of reflected and scattered fields for the analysis of substrate optical quality
Carole Deumié1, Oliver Gilbert, Gaelle Georges
1Institut Fresnel, Ecole Généraliste d'Ingénieurs de Marseille, Université Paul Cézanne Aix-Marseille III, Université de Provence Aix-Marseille I, Domaine Universitaire de St. Jérôme, France. carole.deumie@fresnel.fr
Abstract:
Specular ellipsometry is a well-known and efficient technique to characterize surfaces and coatings. This technique has been extended to the measurement of scattered light. We present an experimental setup, using a polarization modulator, which permits us to characterize transition layers and roughness without a calibration procedure. Experimental results are presented concerning transition layers for damage threshold applications and for rough surfaces or bulks.
