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Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers
Maria-Guglielmina Pelizzo1, F Frassetto, P Nicolosi
1Istituto Nazionale per la Fisica della Materia-Laboratory for Ultraviolet and X-Ray Optical Research and Dipartimento di Ingegneria dell' Informazione, via Gradenigo 6B, 35131 Padua, Italy. pelizzo@dei.unipd.it
Applied Optics
|April 4, 2006
Abstract:
A Mo-Si multilayer mirror has been used for determination of the ellipticity and higher-order content of a synchrotron beam. The method is based on the angular measure of multilayer reflectivity in the region of Bragg first- and second-order reflections. Beam parameters were derived by a fitting procedure.
