ROC and loss function analysis in sequential testing

Arno M M Muijtjens1, Scheltus J Van Luijk, Cees P M Van Der Vleuten

  • 1Department of Educational Development and Research, University of Maastricht, P.O. Box 616, 6200, MD, Maastricht, The Netherlands. a.muijtjens@educ.unimaas.nl

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