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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Attenuation of seismic waves by grain boundary relaxation

D D Jackson1

  • 1Institute of Geophysics and Planetary Physics, University of California, Los Angles, Calif. 90024.

Proceedings of the National Academy of Sciences of the United States of America
|July 1, 1971
PubMed

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