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Updated: Aug 9, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
Direct observations of atomic diffusion by scanning transmission electron microscopy
1Department of Physics and the Enrico Fermi Institute, The University of Chicago, Chicago, Illinois 60637.
Abstract:
The feasibility of using a high-resolution scanning transmission electron microscope to study the diffusion of heavy atoms on thin film substrates of low atomic number has been investigated. We have shown that it is possible to visualize the diffusion of individual uranium atoms adsorbed to thin carbon film substrates and that the observed motion of the atoms does not appear to be induced by the incident electron beam.
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