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Related Experiment Videos

Fourier-transform analysis of normal photoelectron diffraction data for surface-structure determination.

Z Hussain1, D A Shirley, C H Li

  • 1Materials and Molecular Research Division, Lawrence Berkeley Laboratory and Department of Chemistry, University of California, Berkeley, California 94720.

Proceedings of the National Academy of Sciences of the United States of America
|September 1, 1981
PubMed
Summary
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A new method uses normal emission photoelectron diffraction (NPD) to directly determine surface structures. This technique accurately measures adsorbate-substrate distances, revealing interplanar spacings with high precision.

Area of Science:

  • Surface Science
  • Materials Science
  • Solid-State Physics

Background:

  • Determining precise adsorbate-substrate distances is crucial for understanding surface phenomena.
  • Traditional methods can be complex and time-consuming.

Purpose of the Study:

  • To present a direct method for surface-structure determination using normal emission photoelectron diffraction (NPD).
  • To demonstrate the capability of NPD for measuring adsorbate-substrate interlayer distances accurately.

Main Methods:

  • Utilizing Fourier transforms of calculated NPD intensities.
  • Applying dynamical theory to generate theoretical NPD curves for the Se/Ni system.

Main Results:

  • Fourier transforms of NPD intensities directly yield peaks corresponding to normal interlayer distances.

Related Experiment Videos

  • Accurate determination of interplanar spacings between overlayers and up to four substrate layers.
  • Achieved accuracy better than 3% for determined spacings.

    • Conclusions:

    • The presented direct method offers an efficient approach for surface-structure analysis.
    • NPD is a powerful tool for precise determination of surface and interface structures.
    • The method's accuracy is validated by theoretical calculations on the Se/Ni system.