Near-field optical microscopy and spectroscopy with pointed probes
Lukas Novotny1, Stephan J Stranick
1The Institute of Optics, University of Rochester, Rochester, New York 14627, USA. novotny@optics.rochester.edu
Annual Review of Physical Chemistry
|April 8, 2006
Summary
Apertureless near-field techniques enable nanoscale chemical and material analysis using spectroscopic contrast. This review covers advancements in pointed probe microscopy for sub-100 nm imaging.
Area of Science:
- Optics and Photonics
- Nanotechnology
- Spectroscopy
Background:
- Near-field optical microscopy traditionally used aperture-based probes.
- Apertureless techniques offer enhanced capabilities for nanoscale analysis.
- Spectroscopic contrast mechanisms are crucial for detailed material characterization.
Purpose of the Study:
- To review the evolution of near-field optical microscopy.
- To highlight advancements in apertureless probe techniques.
- To discuss theoretical and experimental progress in the field.
Main Methods:
- Exploitation of far-field illumination with pointed, apertureless probes.
- Implementation of spectroscopic contrast mechanisms (Raman, IR absorption).
- Utilizing dielectric dispersion for materials contrast.
Main Results:
- Apertureless techniques enable spectroscopic contrast at sub-100 nm scales.
- Advances in theoretical descriptions of probe-field interactions.
- Progress in experimental scattering and excitation probe techniques.
Conclusions:
- Apertureless near-field microscopy is a rapidly advancing field.
- These techniques provide powerful tools for nanoscale chemical and materials science.
- Further theoretical and experimental developments are expected.
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