Survival probability time distribution in dielectric cavities.

Jung-Wan Ryu1, Soo-Young Lee, Chil-Min Kim

  • 1National Creative Research Initiative Center for Controlling Optical Chaos, Pai-Chai University, Daejeon 302-735, Korea.

Summary

This study analyzes survival probability time distributions (SPTD) in dielectric cavities. SPTD behavior varies with cavity shape, showing algebraic or exponential decay influenced by factors like the Brewster angle and refractive index.

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