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Updated: Aug 9, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
07:38

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

Non-Poissonian exciton populations in semiconductor nanocrystals via carrier multiplication

Richard D Schaller1, Victor I Klimov

  • 1Chemistry Division, C-PCS, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA.

Physical Review Letters
|April 12, 2006
PubMed

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