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Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Theoretical structure factors for selected oxides and their effects in high-resolution electron-microscope (HREM)

B Deng1, L D Marks

  • 1Department of Materials Science and Engineering, Northwestern University, 2220 Campus Drive, Cook Hall 2036, Evanston, IL 60208-3108, USA.

Acta Crystallographica. Section A, Foundations of Crystallography
|April 15, 2006
PubMed

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