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Pseudoscopic imaging in a double diffraction process with a slit: critical point properties.
José J Lunazzi1, Noemí I Rivera
1Universidade Estadual de Campinas, Instituto de Física Gleb Wataghin, Campinas, SP, Brazil. lunazzi@ifi.unicamp.br
Summary
Researchers created pseudoscopic (inverted depth) images using a double diffraction process. This method enables continuous parallax and image enlargement up to infinite magnification under white light.
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