A fit method for the determination of inherent filtration with diagnostic x-ray units

A method for the determination of total inherent filtration for clinical x-ray units using attenuation curves was devised. A model for the calculation of x-ray spectra is used to calculate kerma values which are then adjusted to the experimental data in minimizing the sum of the squared relative differences in kerma using a modified simplex fit process. The model considers tube voltage, voltage ripple, anode angle and additional filters. Fit parameters are the thickness of an additional inherent Al filter and a general normalization factor. Nineteen sets of measurements including attenuation data for three tube voltages and five Al-filter settings each were obtained. Relative differences of experimental and calculated kerma using the data for the additional filter thickness are within a range of -7.6% to 6.4%. Quality curves, i.e. the relationship of additional filtration to HVL, are often used to determine filtration but the results show that standard quality curves do not reflect the variety of conditions encountered in practice. To relate the thickness of the additional filter to the condition of the anode surface, the data fits were also made using tungsten as the filter material. These fits gave an identical fit quality compared to aluminium with a tungsten filter thickness of 2.12-8.21 microm which is within the range of the additional absorbing layers determined for rough anodes.