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Reticulography: a simple and sensitive technique for mapping misorientations in single crystals.

A R Lang, A P Makepeace

    Journal of Synchrotron Radiation
    |November 1, 1996
    PubMed
    Summary
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    A novel X-ray mesh method precisely maps crystal lattice misorientations. This technique enables detailed analysis of crystal defects and orientation variations, advancing materials science research.

    Area of Science:

    • Materials Science
    • Crystallography
    • X-ray Diffraction Imaging

    Background:

    • Laue X-ray diffraction is crucial for analyzing crystal structures.
    • Accurate measurement of crystal lattice orientation differences is essential for materials characterization.

    Purpose of the Study:

    • To develop a method for mapping misorientation vectors in crystal lattices.
    • To quantify orientation differences between crystal elements using X-ray topography.

    Main Methods:

    • Interposing an X-ray absorbing mesh between the crystal specimen and detector.
    • Recording the split diffracted beam array at multiple distances to measure microbeam direction differences.
    • Analyzing the microbeam array images to derive misorientation vector maps.

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    Main Results:

    • The X-ray mesh method successfully splits diffracted beams into measurable microbeam elements.
    • Misorientation vector maps were derived from the microbeam array images.
    • The technique demonstrated high precision, with misorientation detection limits below 1 arc second, influenced by X-ray source angular size.

    Conclusions:

    • The developed X-ray mesh technique provides a precise and effective way to map crystal lattice misorientations.
    • This method offers valuable insights into crystal lattice defects and structural properties.
    • The technique is applicable to various crystalline materials with different diffracting properties.