Related Experiment Video
Updated: Aug 8, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Dynamical identification of a threshold instability in Si-doped heterofullerenes
M Matsubara1, J Kortus, J-C Parlebas
1Institut de Physique et de Chimie des Matériaux de Strasbourg, 23 rue du Loess, Boîte Postale 43 F-67034 Strasbourg Cedex 2, France.
Abstract:
We rationalize the origins of a threshold instability and the mechanism of finite temperature fragmentation in highly Si-doped C(60-m)Si(m) heterofullerenes via a first-principles approach. Cage disruption is driven by enhanced fluctuations of the most internal Si atoms. These are located within fully segregated Si regions neighboring the C-populated part of the cage. The predominance of inner Si atoms over those involved in Si-C bonds marks the transition from thermally stable to unstable C(60-m)Si(m) systems at m = 20.
More Related Videos
11:33All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
06:57Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on: July 17, 2020
Related Concept Videos
Carrier Generation and Recombination
This process is given by the generation rate G and is efficient due to the conservation of momentum between the valence band maximum and conduction band minimum.
Indirect generation involves an...
Types of Semiconductors
Stability of Conjugated Dienes
A comparison of the enthalpies of hydrogenation of dienes reveals that conjugated dienes release less heat on hydrogenation, rendering them more stable than their nonconjugated analogs.