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Exploring the facets of "soft crystals" using an Atomic Force Microscope

C Even1, M Impéror-Clerc, P Pieranski

  • 1Laboratoire de Physique des Solides, UMR 8502, Université Paris-Sud, 91405 Orsay, France. even@lps.u-psud.fr

The European Physical Journal. E, Soft Matter
|May 31, 2006
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...