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06:46
Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Fluorescence X-ray absorption spectroscopy using a Ge pixel array detector: application to high-temperature
H Oyanagi1, A Tsukada, M Naito
1National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba 305-8568, Japan. h.oyanagi@aist.go.jp
Journal of Synchrotron Radiation
|June 27, 2006
Summary
A new detector precisely measures the local atomic structure in thin superconducting crystals. This method accurately probes crystal distortions caused by substrate differences without interference.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Solid State Chemistry
Background:
- High-temperature superconducting thin films are crucial for advanced electronic applications.
- Understanding their local atomic structure is key to optimizing performance.
- Existing methods can be limited by substrate interference and resolution.
Purpose of the Study:
- To develop and apply a novel X-ray absorption spectroscopy technique for probing the local structure of thin superconducting films.
- To accurately analyze the local CuO6 octahedron distortions in (La,Sr)2CuO4 thin films.
- To demonstrate the capability of the technique for low-temperature, high-accuracy measurements without substrate interference.
Main Methods:
- Utilized a 100-segment Germanium (Ge) pixel array detector for fluorescence X-ray absorption spectroscopy.
- Employed grazing-incidence angle (theta) optimization and azimuthal angle (phi) adjustment to obtain clear extended X-ray absorption fine structure (EXAFS) signals.
- Analyzed EXAFS oscillations to determine local structural parameters of the CuO6 octahedron.
Main Results:
- Successfully obtained smooth EXAFS oscillations for strained (La,Sr)2CuO4 thin-film single crystals.
- Quantified uniaxial distortion in the CuO6 octahedron, with changes in tetragonality around 5 x 10(-3).
- Correlated observed distortions with crystallographic lattice mismatch from LaSrAlO4 and SrTiO3 substrates.
Conclusions:
- The Ge pixel array detector enables accurate, real-time inspection of thin-film local structure.
- The technique effectively probes substrate-induced lattice distortions in high-temperature superconductors.
- This method provides a reliable approach for characterizing thin-film materials at low temperatures.
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