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Identification and distance measures of measurement apparatus
Zhengfeng Ji1, Yuan Feng, Runyao Duan
1State Key Laboratory of Intelligent Technology and Systems, Department of Computer Science and Technology, Tsinghua University, Beijing 100084, China. jizhengfeng98@mails.tsinghua.edu.cn
Abstract:
We propose simple schemes that can perfectly identify projective measurement apparatuses secretly chosen from a finite set. Entanglement is used in these schemes both to make possible the perfect identification and to improve the efficiency significantly. Based on these results, a brief discussion on the problem of how to appropriately define distance measures of measurements is also provided.
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