Igor Ivanisevic1, David E Bugay, Simon Bates
1SSCI Inc, 3065 Kent Ave, West Lafayette, Indiana 47906, USA. iivanisevic@ssci-inc.com
A new pattern matching algorithm for X-ray powder diffraction (XRPD) data improves accuracy by analyzing full peak profiles. This method aids in pharmaceutical development tasks like polymorph screening.
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