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Updated: Aug 7, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Determination of defect states in semiconductor nanocrystals by cyclic voltammetry
Erol Kuçur1, Wendelin Bücking, Ralf Giernoth
1Material Research Center, University of Freiburg, Stefan-Meier Strasse 21, 79104 Freiburg, Germany.
Abstract:
Colloidal, monodisperse CdSe nanocrystals were homogeneously dispersed in an ionic liquid and investigated by means of cyclic voltammetry. Almost all known defect states in semiconductor nanocrystal were quantitatively measured with this nonoptical method (including nonradiative defect states). Variation of the illumination and temperature resulted in excitation of defect-trapped electrons into the conducting band. Thus, we succeeded for the first time to correlate defect states in nanocrystals with those in the corresponding bulk crystals.
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