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Updated: Aug 7, 2026

Simulation, Fabrication and Characterization of THz Metamaterial Absorbers
Published on: December 27, 2012
Fourier transform approach for thickness estimation of reflecting interference filters
1Institute for Microstructural Sciences, National Research Council of Canada, 1200 Montreal Road, Ottawa, Ontario K1A 0R6, Canada. pierre.verly@nrc-cnrc.gc.ca
Abstract:
An empirical procedure based on optical-density-bandwidth products was recently proposed for thickness estimation of dielectric thin film reflectors. A parallel is established with new results derived from the Fourier transform thin film synthesis technique. Two Fourier-transform approaches are proposed and justified by numerical examples.
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