Precision of stereological planar area predictors

Kiên Kiêu1, Marianne Mora

  • 1Unité Mathématiques et Informatique Appliquées, Institut National de la Recherche Agronomique, Domaine de Vilvert, 78352 Jouy-en-Josas Cedex, France. kien.kieu@jouy.inra.fr

Journal of Microscopy
|July 29, 2006
PubMed
Summary

Estimating total planar area using sampling methods is improved with new formulas for mean squared errors. These formulas, dependent on boundary length and sampling scheme, are computed using an R package for accuracy assessment.

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