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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Published on: July 26, 2014
Preparation of TEM samples of metal-oxide interface by the focused ion beam technique
S Abolhassani1, Philippe Gasser
1Paul Scherrer Institut, Laboratory for Materials Behaviour, 5232 Villigen-PSI Switzerland. sousan.abolhassani@psi.ch
Abstract:
This paper describes a procedure to prepare metal-oxide interfaces for transmission electron microscopy by the focused ion beam technique. The advantage of this procedure is to allow the observation of metal-oxide interfaces of irradiated samples with a homogeneous thickness without the need to have an instrument inside laboratories that are specialized for the manipulation of irradiated materials. A transmission electron microscopy sample is prepared by this method and analysed.
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