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Recent progress of nano-technology with NSOM
1Department of Physics, University of Incheon, 177 Dohwa-Dong, Nam-Gu, Incheon 402-749, Republic of Korea. jhk@incheon.ac.kr
Micron (Oxford, England : 1993)
|August 8, 2006
Summary
Near-field scanning optical microscopy (NSOM) advances nano-scale chemical analysis. This survey covers NSOM developments, spectroscopy, probe technology, and applications in nano-structured metallic surfaces.
Area of Science:
- Nanotechnology
- Optical Microscopy
- Spectroscopy
Background:
- Near-field scanning optical microscopy (NSOM) has emerged as a pivotal technology in nanoscience.
- Significant advancements have been made in both aperture and apertureless NSOM techniques.
Purpose of the Study:
- To survey recent progress in nanotechnology utilizing NSOM.
- To highlight NSOM's capabilities in nano-scale spectroscopy and material analysis.
Main Methods:
- Review of aperture and apertureless NSOM developments.
- Analysis of NSOM-combined spectroscopy, including nano-scale Raman and IR spectroscopy.
- Examination of NSOM applications for studying nano-structured metallic surfaces.
Main Results:
- Apertureless NSOM enables chemical information retrieval at the few-nanometer scale.
- Recent achievements in nano-scale Raman and IR spectroscopy using NSOM are presented.
- NSOM is demonstrated as a tool for researching nano-optic elements via surface plasmon polaritons.
Conclusions:
- NSOM is a powerful technique for nano-scale characterization and analysis.
- The integration of NSOM with spectroscopy offers unprecedented chemical sensitivity.
- NSOM applications extend to the design and study of advanced nano-structured materials and devices.