Recovery of reliability by retest after a 5-minute interval in frequency doubling technology perimetry

Hidetoshi Tsukamoto1, Satoshi Mukai2, Aiko Iwase3

  • 1Department of Ophthalmology and Visual Sciences, Hiroshima University Graduate School of Biomedical Sciences, Hiroshima, Japan. htsuka@hiroshima-u.ac.jp.

Abstract

Related Concept Videos