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Updated: Aug 6, 2026
10:53
Scanning-probe Single-electron Capacitance Spectroscopy
Published on: July 30, 2013
Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy
Peter N Moar1, John D Love, François Ladouceur
1BERATA GmbH, Munchen, Germany.
Applied Optics
|August 17, 2006
Abstract:
We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab waveguide model is utilized to minimize the analytical complexity, yet provides useful quantitative results--including losses associated with the metal coating--which can then be used as design rules.
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