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High-speed phase-stepped digital speckle pattern interferometry using a complementary metal-oxide semiconductor

Tao Wu1, Julian D C Jones, Andrew J Moore

  • 1School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, UK.

Applied Optics
|August 24, 2006
PubMed
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This study introduces a digital speckle pattern interferometer using a CMOS camera for dynamic deformation measurement. It determines the maximum measurable surface velocity for reliable interframe phase stepping, crucial for high-speed deformation analysis.

Area of Science:

  • Optics and Photonics
  • Materials Science and Engineering
  • Mechanical Engineering

Background:

  • Dynamic deformation analysis is critical in various engineering fields.
  • Traditional interferometry methods face limitations in speed and resolution.
  • Digital speckle pattern interferometry offers a promising alternative for non-contact measurement.

Purpose of the Study:

  • To present a digital speckle pattern interferometer utilizing a CMOS camera.
  • To investigate the measurement capabilities of interframe phase stepping for dynamic deformation.
  • To establish the limits of surface velocity measurement for this technique.

Main Methods:

  • Implementation of a digital speckle pattern interferometer with a CMOS camera.
  • Utilizing interframe phase stepping for temporal evolution of dynamic deformation.

Related Experiment Videos

  • Employing full-field time-averaged and time-resolved measurements up to 70 kHz.
  • Conducting numerical and analytical investigations to determine measurement limits.

    • Main Results:

    • The system enables full-field time-averaged and time-resolved measurements of dynamic deformation.
    • Measurements can be performed at sampling rates up to 70 kHz.
    • A key finding is the determination of the maximum measurable surface velocity for interframe phase stepping.

    Conclusions:

    • The developed CMOS-based digital speckle pattern interferometer is effective for dynamic deformation analysis.
    • Interframe phase stepping provides a viable method for time-resolved deformation measurements.
    • The study quantifies the velocity limits for reliable measurements, aiding in system optimization.