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High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques
Published on: December 3, 2013
Development of a line-scan CCD-based fringe tracker for optical interferometry.
Agustí Pintó1, Ferran Laguarta
1Center for Sensors, Instrumentation and Systems Development (CD6), Technical University of Catalonia (UPC), Terrassa, Spain. pinto@oo.upc.edu
Applied Optics
|August 24, 2006
Summary
A novel fringe tracking system stabilizes interferometers in uncontrolled environments. This active control system reduces mechanical perturbations by 200x, enabling nanometer-scale measurements.
Area of Science:
- Optical Engineering
- Metrology
- Adaptive Optics
Background:
- High-precision optical techniques like interferometry are increasingly needed in non-controlled environments.
- Large-aperture interferometers, such as the UPC-ZEBRA, face challenges measuring nanometer-scale piston errors due to mechanical perturbations.
- Existing methods struggle to maintain precision in dynamic settings.
Purpose of the Study:
- To develop a robust system for stabilizing interferometers in challenging environments.
- To mitigate nanometer-scale measurement errors caused by mechanical disturbances.
- To enhance the precision of large-aperture interferometers for segmented mirror analysis.
Main Methods:
- Implementation of a line-scan CCD camera for real-time interference fringe tracking.
- Development of a closed-loop control system utilizing fringe tracking error signals.
- Active stabilization of the interferometer to counteract external perturbations.
Main Results:
- Successful tracking of interference fringes using a line-scan CCD system.
- Significant attenuation of mechanical perturbations by a factor of 1/200.
- Demonstrated feasibility of nanometer-scale piston error measurements in non-controlled settings.
Conclusions:
- The developed fringe tracking and closed-loop control system effectively stabilizes interferometers.
- This approach significantly enhances measurement accuracy in environments with mechanical disturbances.
- The system provides a viable solution for high-precision metrology in demanding applications.
