Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Search for the Y(2175) in the Photoproduction Cross Section Measurement of γp→ϕπ^{+}π^{-}p at GlueX.

Physical review letters·2026
Same author

Effects of fluid flow and solute transport on anorthite dissolution rates in heterogeneous pore networks.

RSC advances·2026
Same author

Building a comprehensive quality infrastructure in a large radiography practice.

Radiography (London, England : 1995)·2026
Same author

Laboratory Demonstration of Collisionless Blob Formation via Laser-Produced Plasma Self-Focusing.

Physical review letters·2025
Same author

Upper Limit on the Photoproduction Cross Section of the Spin-Exotic π_{1}(1600).

Physical review letters·2025
Same author

Rates of colorectal cancer diagnosis and mortality in people with severe mental illness: results from Australia's National Bowel Cancer Screening Programme.

Epidemiology and psychiatric sciences·2024

Related Experiment Video

Updated: Jul 20, 2026

Atom Probe Tomography Analysis of Exsolved Mineral Phases
08:14

Atom Probe Tomography Analysis of Exsolved Mineral Phases

Published on: October 25, 2019

In situ site-specific specimen preparation for atom probe tomography.

K Thompson1, D Lawrence, D J Larson

  • 1Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Suite 100, Madison, WI 53719, USA. kthompson@imago.com

Ultramicroscopy
|August 30, 2006
PubMed
Summary

Rapid atom probe sample preparation from silicon wafers is now possible. Focused ion beam techniques minimize gallium damage, enabling high-quality analysis of nano-structures.

More Related Videos

Scanning Transmission Electron Microscopy Tomography in Virology: 3D Imaging of High-pressure Frozen, Freeze-substituted Samples
09:17

Scanning Transmission Electron Microscopy Tomography in Virology: 3D Imaging of High-pressure Frozen, Freeze-substituted Samples

Published on: August 6, 2025

Related Experiment Videos

Last Updated: Jul 20, 2026

Atom Probe Tomography Analysis of Exsolved Mineral Phases
08:14

Atom Probe Tomography Analysis of Exsolved Mineral Phases

Published on: October 25, 2019

Scanning Transmission Electron Microscopy Tomography in Virology: 3D Imaging of High-pressure Frozen, Freeze-substituted Samples
09:17

Scanning Transmission Electron Microscopy Tomography in Virology: 3D Imaging of High-pressure Frozen, Freeze-substituted Samples

Published on: August 6, 2025

Area of Science:

  • Materials Science
  • Nanotechnology
  • Analytical Chemistry

Background:

  • Atom probe tomography (APT) requires precisely prepared samples.
  • Traditional methods can be time-consuming and destructive.
  • Direct sample extraction from silicon wafers presents unique challenges.

Purpose of the Study:

  • To develop rapid, site-specific sample preparation techniques for APT directly from silicon wafers.
  • To investigate and mitigate gallium-induced damage during focused ion beam (FIB) sharpening.
  • To enable high-quality APT analysis of nano-scale structures.

Main Methods:

  • Systematic mounting of 12+ samples onto a microtip array.
  • Site-specific annular mill extraction for targeted device removal.
  • Focused ion beam (FIB) sharpening at 30 keV.
  • Low-energy (5 keV and 2 keV) ion beam 'clean-up' for damage reduction.
  • Atom probe tomography analysis.

Main Results:

  • Sample preparation time reduced to approximately 2 hours.
  • Gallium penetration depth at 30 keV is ~40 nm in {100} Si.
  • Low-energy clean-up reduced damaged Si depth to ~5 nm (5 keV) and <1 nm (2 keV).
  • Successful APT analysis of NiSi extracted from a Si wafer.

Conclusions:

  • Rapid, site-specific sample preparation for APT from Si wafers is feasible.
  • Low-energy ion beam cleaning effectively minimizes FIB-induced damage.
  • Preservation of nano-structures allows for high-quality atom probe analysis.